Articles & News
Benefits of ML in Semiconductor Yield Analysis
In semiconductor manufacturing, small problems can quickly turn into expensive ones. Identifying why a batch underperforms—or worse, fails—used to mean digging through endless spreadsheets, manually checking columns...
Visualizing Wafer Maps: Challenges and Solutions
Wafer maps are a cornerstone of semiconductor yield analysis. But if you’ve ever tried making sense of a cluttered bin map or connecting failures to test conditions, you know the process isn’t always smooth. The challenge isn't just about...