the market faster.
Boost yield. reduce cost & hit
Modern chips demand more than just performance, they need to be testable, traceable, and built for quality from the start.
SilTest’s Design for Test (DFT) services ensure your silicon is production-ready, with minimal risk and maximum efficiency.
WHY IT MATTERS
Modern silicon isn’t just about performance, it’s about predictability, quality, and scale.
SilTest’s Design for Test (DFT) services ensure your chip is production-ready from the start.
enabling:
-
Higher first-pass yield
-
Faster time-to-market
-
Built-in support for zero-defect and automotive compliance
Over 60% of respins are due to test-related oversights. DFT prevents that.
automotive compliant
THE PROBLEM WE SOLVE
Too many designs reach tape-out without a robust test strategy,
because the focus stays on design features, performance targets, or getting to silicon first. Test planning gets sidelined, seen as a post-design task instead of a core part of product success. The consequences?
-
60% + of respins stem from DFT/test issues
-
Up to 40% of test cost happens post-silicon
-
Automotive-grade chips require ASIL/AEC-Q100 compliance
-
Poor DFT adds 3–6 months to production timelines
If you want to scale confidently, DFT must be part of design, not an afterthought.
Want to avoid delays in production? Learn how we bridge DFT with Test Engineering and Yield Management to accelerate NPI.
Our Solution
In Action.
Package
Comparison.
Package Name
Lite
Full Stack
Total Integration
Coverage
Basic scan + MBIST
Full scan + repair flows
Full DFx + zero-defect strategy
What You Get
-
DFT feasibility review and scan readiness check
-
Fault model selection (stuck-
at, transition, etc.)
-
High-level scan chain planning
-
MBIST/BIST strategy advice
-
Documentation and next steps
recommendations
-
Scan chain + compression
-
insertion
-
LBIST / MBIST integration
-
Fuse + redundancy handling
-
(eFuse, OTP)
-
Gate-level netlist validation and timing sign off
-
Training session for internal teams
-
Turnkey scan + BIST integration
-
Full repair strategy (redundancy, fuses)
-
Integration of IJTAG, ASIL safety hooks
-
Test mode control architecture + safety mechanisms
-
Knowledge transfer + cross-functional training
-
DFT + DFMEA alignment for ISO 26262
Delivery
Design report + planning
documents
Fully packaged DFT scripts +
documentation
Full flow with support
Compliance
Optional AEC-Q100 guidance
AEC-Q100 and DFx guidelines
covered
ASIL readiness + DFx
Support
Email support during the project
Email + video call support
Full collaboration
Lite
For Startups, MPW runs
Coverage: Basic Scan + MBIST
Delivery: Scripts only
Compliance: Basic
Support: Email-based
Full Stack
For Scaling teams
Coverage: Full scan + repair flows
Delivery: Scripts + training
Compliance: Moderate
Support: Email + video sessions
Total Integration
For enterprise, Safety-critical
Coverage: Zero-defect + full DFx strategy
Delivery: Full flow setup + team onboarding
Compliance: ASIL readiness, AEC-Q100 alignment
Support: Full collaboration
Choose your plan.
Find one that works for you
For post-DFT validation, see our Test Engineering services
Tools &
Compliance.
Tools
Siemens (Mentor)
Synopsys
Cadence
Standards
AEC-Q100
ASIL A–D
Project Tools
Confluence
DOORS
Jama
Jira