From patterns to insights. From insights to action.
Every chip that fails in production costs more than just revenue. SilTest helps you monitor, analyze, and optimize yield across engineering samples, pilot runs, and full-scale manufacturing, with visibility down to the root cause.
OUR YIELD ANALYSIS FRAMEWORK
Once corrective actions begin, consistency and traceability become essential.
At SilTest, we apply a repeatable framework designed to turn fragmented data into ongoing process improvement.
Our Four Core Pillars:
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Cross-Stage Correlation
We connect data from wafer, final test, packaging, and qualification to pinpoint where issues truly begin, not just where they appear.
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Root Cause Classification
Failure signatures are mapped using a structured RCA model, enabling fast triage across design, process, and equipment variables.
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Noise Filtering & Bin Validation
We isolate marginal bins, tester-related artifacts, and pattern-level noise that skew visibility, especially in multi-site or multi-ATE setups.
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Feedback Loop Integration
Every finding is routed to the appropriate team: Test Engineering for test optimization, Packaging & Qualification for mechanical reliability, or YieldOptiX for automated tracking.
How
We Work.
Instead of jumping into reports, we embed ourselves in your test ecosystem
Test Data → Correlation → Root Cause Tree → Resolution Path
Package
Comparison.
Package Name
Lite
Full Stack
Total Integration
Coverage
Diagnostic Audit
Cross-Stage Yield Analysis
Integrated Yield Engineering
What
You Get
-
1 test stage yield audit (Wafer Test or FT)
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Yield summary
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Trend and bin checks
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Noise filtering and tester artifact detection
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Initial analysis on major yield detractors and potential issues
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Using our own tools (YieldOptiX)
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Everything in the Lite Package
+
-
Yield correlation across multiple lots/stages
-
Parametric trend monitoring
-
Root cause tagging and classification
-
Using the client's preferred tool (license to be provided by the Client)
-
Everything in the Full Stack Package
+
-
Full-stack dashboard across wafer, FT, qual, packaging
-
Commonality analysis across fabs/sites/handling
-
Bin stability tracking and escape mapping
-
Automated scripts, alerting, and reporting
-
Embedded support during ramp
Delivery
Excel/PDF report
Coverage reports + action
suggestions
All reports, scripts and dashboards
Compliance
No formal PPAP support
AEC-Q100 analysis support
Full traceability for PPAP, ISO
26262, AEC-Q100
Support
Email + 1 review call
Weekly syncs and shared review dashboard
Embedded team + weekly
collaboration
Lite
For: Debug & pre-qual
Scope: Bin & parametric trend checks
Support: Asynchronous, per report
Tools: Excel, PDFs
Full Stack
For: Engineering runs + yield ramp
Scope: Cross-lot, cross-site analytics
Support: Weekly meetings + reviews
Tools: Galaxy, PDF, YieldOptiX, SQL
Total Integration
For: Production-grade NPI, automotive, mixed-fab
Scope: Global yield dashboard, RCA, corrective action
Support: Embedded support + design feedback loop
Tools: Custom dashboards, failure tracking, and qual links
Choose your plan.
Find one that works for you
Not ready for full integration? We can start with a diagnostic yield audit, one-time, fixed-scope
Related
Services.
Poor test coverage → bad yield visibility → fix with Test Engineering
Yield dips post-packaging? Explore Packaging & Qualification
Need automated alerts and dashboards? See YieldOptiX