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Unlock Test and Yield Insights Like Never Before

 
 
 
 
 
 
 
 
 
 
 
 
 

Overview.

 

A 3-day hands-on, expert-led course focused on mastering JMP and YieldOptiX tools. Learn to analyze semiconductor test and yield data effectively, accelerating debugging and improving decision-making. This course prepares you to become a certified yield analyst, equipped with practical skills for real-world challenges.

and what it takes to become a test engineer 

TARGET AUDIENCE

  • Test engineers and technicians

  • Quality assurance professionals in chip manufacturing

  • Production engineers involved in test process optimization

  • New graduates or professionals transitioning into semiconductor testing roles

  • Engineers learning Advantest, Teradyne, or Chroma

  • Managers overseeing test operations

OBJECTIVES

 By the end of this course

 

  Participants will learn:

  •  Fundamentals of STDF data and yield metrics​

  • Master basic JMP features for test/yield data exploration 

  • Excel and JMP synergy for smarter test teams 

  • Use YieldOptiX to accelerate debug, detect anomalies, and visualize yield 

  • Fast data loading and navigation with YieldOptiX EasyLaunch​

  • Identify failing bins, explore wafers, and perform Pareto analysis 

  • Leverage ML features in YieldOptiX for deeper insight and automation​

  • Apply clustering and ML techniques for root cause insights​

  • Automate screening, report generation, and limit simulation workflows 

FORMAT & DELIVERY

  • Duration 

      3-day, 3h per day​

​

  • Format:

  1. Live online sessions with guided exercises

  2. Interactive discussions and case studies

  3. Course materials and datasets provided

​

  • Delivery Mode: Available both in-person and online (live virtual sessions)

  • Language: English

Course Curriculum.

 
 

Day 1: Fundamentals of Yield and Test Data Analysis with JMP & STDF 

​

  • Introduction to STDF, datalogs, test stages (FT, WS, SLT) 

  • JMP essentials for semiconductor: distributions, maps, binning 

  • Basic filtering, grouping, and drill-down 

  • Exporting summary reports 

 
 
 

Day 2: Rapid Yield Improvement with YieldOptiX 

​

  • EasyLaunch: loading STDF files and session management 

  • Interactive wafer maps & bin distribution analysis 

  • Test Explorer: identify failing tests, generate bin Pareto charts 

  • Screen&Release module: managing risk in lot disposition 

  • Global Test Limits Control: limit simulation for better yield-quality tradeoffs 

  • Excel export with colors and filters 

 
 
 

Day 3: Advanced Analytics & Machine Learning in YieldOptiX 

​

  • Drift Analysis: qualify lot stability and detect trends 

  • Clustering: detect hidden fail patterns across tests and wafers 

  • Decision Trees & KNN for root cause exploration 

  • Real-time Process Window Characterization 

  • Automating reporting and sharing results in multi-site environments 

  • Case study: A-to-B comparison of production vs returns 

 

Instructor.

 
 
 
 

Senior Executive with 16 years of experience working with JMP, Fab operations, Semiconductor Process technologies, statistical data analytics, and quality improvement. Held senior roles with companies like Apple, Global Foundries and Intel. 

Assesement.

 
 
 
 

​​​The following assessment activities are available to participants

​

  • Participants who attend the full course will receive a SilTest Academy certificate of attendance.

  • There will be a multiple-choice end of course test .

Seats are limited. Download the brochure or register your interest.

Frequently
Asked Questions.

If you still have questions please contact nermine.ben.aribia@siltest.com

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