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Master ATE Platforms for Real-World Chip Testing

 
 
 
 
 
 
 
 
 
 
 
 

Overview.

 

This 2-week immersive training is designed to equip engineers and technicians with the practical skills and in-depth knowledge needed to operate leading Automated Test Equipment (ATE) platforms. Participants will gain hands-on experience with Advantest (V93K, T2000), Teradyne (UltraFLEX, J750, ETSxx), or Chroma systems, covering both hardware and software aspects of real-world chip testing.

and what it takes to become a test engineer 

TARGET AUDIENCE

  • Test engineers and technicians

  • Quality assurance professionals in chip manufacturing

  • Production engineers involved in test process optimization

  • New graduates or professionals transitioning into semiconductor testing roles

  • Engineers learning Advantest, Teradyne, or Chroma

  • Managers overseeing test operations

OBJECTIVES

 By the end of this course

 

  Participants will learn:

  • Understand the architecture of major ATE platforms​

  • Create, debug, and validate production test programs​

  • Use shmoo plots, margin analysis, and diagnostic tools​

  • Configure digital, analog, and RF test modules​

  • Apply real-world debugging workflows from production floors 

FORMAT & DELIVERY

  • Duration & Schedule Options

  1. Intensive: 2 weeks, 4 sessions per week, 4 hours per session

  2. Flexible: 8 weeks, 4 sessions per week, 2 hours per session (ideal for working professionals)

​

  • Format:

  1. Live online sessions with hands-on labs

  2. Interactive Q&A and group exercises

  3. Course materials and test files provided

​

  • Delivery Mode: Available both in-person and online (live virtual sessions)

  • Language: English

Course Curriculum.

 
 

Week 1: Foundations and Platform Familiarization 

​

  • ATE Architecture Overview (V93K, UltraFLEX, ETS-800, T2000, Chroma)​

  • Test Flow Concepts and Execution Engine Operation​

  • Test Pattern Creation, STIL/WGL basics​

  • ATE Instrument Integration and Calibration​

  • Introduction to Simulation, Debugging, and Test Setup 

 
 
 

Week 2: Test Program Development, Debug, and Analysis 

​

Module 1: Test Program Development​

  • Requirement Analysis & Test Strategy Planning​

  • Designing Test Architecture and Procedures​

  • Vector Generation, Instrument Integration, Programming Languages​

  • Test Execution, Validation, and Documentation​​

 

Module 2: Data Analysis & Debug​

  • Data Collection and Statistical Analysis​

  • Fault Diagnosis and Performance Characterization​

  • Yield Analysis, Root Cause Identification, SPC​

  • Debugging the Test Program: Tools, Code Review, and Iterative Testing​

​

​Module 3: Yield Optimization and Production Handoff​

  • Final Debug and Validation Loops​

  • Optimization Techniques to Reduce Test Time​

  • Characterization techniques and data correlation 

  • Case Study Exercises and Hands-On Debug Simulations​

  • Final Review and Certification Assessment 

 
 
 

Instructor.

 
 
 
 

Delivered by SilTest’s senior ATE engineers and guest instructors with deep expertise on 

several ATE platforms such as those from Advantest, Teradyne, Chroma, NI and others. Our 

team has built and debugged test programs for 100+ production chips across multiple 

clients. 

Preparation.

 
 
 
 

Before attending, we recommend

​

Preparing any questions related to this course.

Assesement.

 
 
 
 

​​​The following assessment activities are available to participants

​

  • Participants who attend the full course will receive a SilTest Academy certificate of attendance.

  • There will be a multiple-choice end of course test .

Seats are limited. Download the brochure or register your interest.

Frequently
Asked Questions.

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If you still have questions please contact nermine.ben.aribia@siltest.com

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