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SilTest at MWC Barcelona 2025: Powering Smarter Semiconductor Testing

  • nerminebenaribia
  • Jun 5
  • 2 min read

Updated: Jul 3



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MWC Barcelona 2025 wasn’t just about smartphones and 6G—it was also a powerful reminder of how critical semiconductor test and data intelligence have become in shaping the future of connected devices.


This year, SilTest joined the conversation with a simple message:Testing isn’t a bottleneck. It’s an opportunity.


What We Showcased

At our booth, we unveiled key tools and workflows designed to help teams improve post-silicon test efficiency, reduce escapes, and make better engineering decisions with less manual overhead.


YieldOptiX

An advanced STDF analysis platform that integrates seamlessly with JMP. Engineers use it to:

  • Spot yield dips earlier

  • Visualize failure clusters across wafers

  • Run instant comparisons across lots or test programs

  • Apply AI-driven pattern recognition without writing custom scripts


AutoMigreX

A test automation module that simplifies the migration of test flows across ATE platforms. It’s ideal for engineering teams scaling across geographies or juggling legacy setups.


SilTest Academy

A hands-on training initiative to help chipmakers onboard junior engineers, cross-train teams, or build internal debug and yield analytics skills—using real-world data, not just slides.


Why It Mattered

In conversations with dozens of engineering managers and test teams, a consistent theme emerged:They’re drowning in data—but still struggling to get actionable insight.


Today’s chips are more complex, timelines are tighter, and test escapes are more expensive than ever. What companies need isn't just more data, but smarter ways to process it, across test, qualification, and debug.


This is where SilTest stands out. Our engineering tools are:

  • Purpose-built for post-silicon workflows

  • Deployable on real ATE data (not just academic models)

  • Customizable without being consulting-dependent


By focusing on practical AI, test correlation, and hands-on training, we're helping teams shift test from a reactive function to a predictive advantage.


In Case You Missed It

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We connected with:

  • Fabless companies scaling up for automotive and MEMS

  • R&D labs in need of better debug flows

  • European universities exploring partnership for test curriculum

  • Industry leaders looking for smarter ways to link qual and yield



What This Means for the Industry


Semiconductor innovation doesn’t end at design. It lives in the data, from first silicon to high-volume production.

And the companies who can move fastest from failure to fix, from lot data to yield insight, are the ones who’ll lead the next wave of reliability and efficiency.

We’re proud to have brought that message to MWC, and excited to keep building the tools that make it possible.

 
 
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